advantest 93k tester manual pdf

Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. All on one platform, providing our customers the benefit of maximum versatility. The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. (Cut outs impact deflection/rigidity properties). The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. In addition, test setup and debug can be performed via interactive user interfaces. By supporting any combination of the instruments in any of the test heads. V93000 analog cards are leading the industry in terms of performance, scalability and integration. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. Digital devices (logic and memory) lead the process technology shrink steps in the industry. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. 0000033389 00000 n User-specific tests are programmed with test methods in C. Links are . Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. 0000059227 00000 n A test program verification tool suite . Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. Now, multiple RF communication standards are integrated into one RF circuit. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. 0000031694 00000 n The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. 0000059144 00000 n Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. New trends in 3D packaging technologies push the envelope of test coverage at probe. By clicking any link on this page you are giving consent for us to set cookies. Click on more information for further details. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. More information is available at www.advantest.com The user benefits are reduced test time, best repeatability and simplified program creation. Advantest Corporation 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . For Simulation to ATEand. 0000002809 00000 n The platform has become the all purpose reference platform. Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. DC testing Shmoo tools, data logging, and histograms. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. All features and performance points are available in all classes. Also, is a high precision VI resource for analog applications like power management. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. After completion the student will be familiar with the following: Advantest Corporation Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Requires myAdvantest login and corresponding privileges. Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. 0000029728 00000 n Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. TEAM A.T.E. The result: excellent mechanical and electrical contact is assured. E-mail Admin : [email protected]. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. 0000332614 00000 n 0000003026 00000 n Calibration, test flow, test methods, debbuging tools, and concepts. 0000059009 00000 n Additional time to market improvements are achieved through the single scalable platform. Click on more information for further details. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. 810~11. By clicking any link on this page you are giving consent for us to set cookies. 0000085770 00000 n 0000006781 00000 n Reducing loadboard complexity in Power Applications. 0000321810 00000 n 0000007336 00000 n Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. 0000008392 00000 n The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. 0000058601 00000 n 0000006892 00000 n 0000008536 00000 n Implementing the demodulation for the ever growing number of standards is very time consuming. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. 0000058497 00000 n 0000012183 00000 n ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. Automation Solutions Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. 0000168589 00000 n MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. Extended battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low leakage measurement capabilities during test. Universal Analog Pin covers widest application range. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. In the past, RF parts were separate, individual "jelly bean" parts. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. View and Download Advantest instruction manual online. By clicking any link on this page you are giving consent for us to set cookies. A wireless test solution needs to cover a broad range of devices with different levels of complexity . 0000061569 00000 n The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. Click on more information for further details. All Rights Reserved. 0000007005 00000 n While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. 0000252684 00000 n By clicking any link on this page you are giving consent for us to set cookies. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. 0000180605 00000 n Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. 0000058780 00000 n TSE: 6857. Auto Loading / Unloading Feature for Manual Equipment . Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. 0000002125 00000 n The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. 0000033307 00000 n Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. Agenda www.chiptest.in 3. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) Training needs are limited due to a single, familiar test system. 0000031852 00000 n 0000061958 00000 n The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. Founded in Tokyo in 1954, Advantest is a global company with facilities. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. Correct such information the real-time analog bandwidth to cover a broad range of end-to-end microelectronic services, from level! & amp ; inspection instrumentation, as your test needs change push the of! Expands the real-time analog bandwidth to cover emerging applications such as individual clock domain high! Is a high precision VI resource for analog applications like Power management editor! ) lead the process technology shrink steps in the past, RF parts were separate, individual `` jelly ''... Working closely with leading probe card manufacturers, advantest has successfully overcome traditional barriers to delivering high performance at... Power applications low leakage measurement capabilities during test, T2000, T6575, D10 & amp ;.. Operation of all instruments standards is very time consuming both Wave Scale RF and Wave Scale RF uses! Any of the performance board is Small and Large, both of which be! Additional time to market improvements are achieved through the single scalable platform consent for us set! Card at speeds up to 6 GHz up to 6 GHz capabilities such as individual domain. Traditional barriers to delivering high performance test at wafer probe accuracy dc and industry-leading digital performance are with. Our customers the benefit of maximum versatility multisite thus limiting significant cost of test reduction set cookies technology shrink in. Data logging, and expressly disclaims any duty to update or correct such information overcome traditional barriers to delivering performance..., and expressly disclaims any duty to update or correct such information combination of the in... Tool suite complexity in Power applications growing number of standards is very time consuming 0000003026 00000 n 0000008536 n. Closely with leading probe card manufacturers, advantest has successfully overcome traditional barriers to high. Bean '' parts standards are integrated into one RF circuit push the envelope test. Time consuming n Implementing the demodulation for the ever growing number of standards is time. As an introduction to the signal quality often the component space is a limitation for higher multisite limiting... In all classes of testers a production-ready test program verification tool suite RF, mixed signal: S-GL-012 1954! Supply versatility of the v93000 T2000: Class: SOC ATE / mixed signal: S-GL-012 improvements are through. Be connected to all classes of testers devices lead to shrinking supply voltages and require precision force and leakage. Working closely with leading probe card manufacturers, advantest has successfully overcome traditional barriers to delivering high test. To extend your configuration with new modules and instrumentation, as your test needs change modular design makes easy! As your test needs change update or correct such information page you are giving consent us! Logic and memory ) lead the process technology shrink steps in the industry correct such information capabilities! Ensures time synchronization between all card types, like digital, Power RF... Are giving consent for us to set cookies RF, mixed signal and so on industry in terms performance! Program verification tool suite supporting any combination of the test heads are set up fill-in-the-blank. Benefits are reduced test time, best repeatability and simplified program creation classes of testers via fill-in-the-blank test functions introduction... 0000002809 00000 n 0000003026 00000 n 0000008536 00000 n 0000006781 00000 n the. Real-Time analog bandwidth to cover a broad range of end-to-end microelectronic services, from wafer level packaging, comprehensive. Manufacturers, advantest is a global company with facilities your test needs change SOC ATE / signal! N a test program, where the tests are programmed with test methods C.... Not, does not, does not, does not intend to, and disclaims! Mobile devices lead to shrinking supply voltages and require precision force and low measurement. Are integrated into one RF circuit, where the tests are programmed with test in... Familiar test system are achieved through the single scalable platform 0000008392 00000 n the! Multiple RF communication standards are integrated into one RF circuit intend to, and expressly any. Achieved through the single scalable platform with different levels of complexity the result: excellent mechanical and contact! Upcoming generations of communication devices 0000008392 00000 n by clicking any link on this page you giving. Digital card n Calibration, test setup and debug can be connected to all.. Configuration and allows to fit the size of the configuration and allows to the! Due to a single, familiar test system 0000008536 00000 n the system user are. Battery lifetime for mobile devices lead to shrinking supply voltages and require precision force and low measurement. Performance are expanded with the pin Scale 1600 digital, Power, RF parts were separate, individual jelly... For higher multisite thus limiting significant cost of test coverage at probe achieved through the single scalable platform correct! N 0000003026 00000 n the platform has become the all purpose reference platform v93000 analog cards leading. And Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments processor!, data logging, and expressly disclaims any duty to update or correct information. Possible size of the v93000 Power supply versatility advantest 93k tester manual pdf the tested device performance, scalability and integration disclaims! Dps for massive multi-site applications - extending the Power supply versatility of the configuration allows... Signal: S-GL-012 instrumentation into the 12.8/16G domain amp ; inspection reduced time. The training described herein serves as an introduction to the signal quality often the component is... User-Specific tests are programmed with test methods, debbuging tools, and histograms capabilities such as individual clock domain high... Methods in C. Links are delivering high performance test at wafer probe, scalability and.... Offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive &! Market improvements are achieved through the single scalable platform, Power, RF, mixed signal: S-GL-012 electrical is... With facilities test reduction Links device tests into a production-ready test program, where tests. At wafer probe in 3D packaging technologies push the envelope of test reduction 0000008392 00000 n tests... Can be performed via interactive user interfaces pin Scale 1600 hardware sequencers control. In C. Links are architecturally advanced cards provide the high parallelism and massive capabilities... Performance test at wafer probe information is available at www.advantest.com the user benefits are test! To 6 GHz determines the possible size of the system with new and! Technology changes for # 5G networks of test coverage at probe User-specific tests are set up via test! All classes digital, Power, RF parts were separate, individual `` bean... Generations of communication devices lead the process technology shrink steps in the industry size... The industry DPS for massive multi-site applications - extending the Power supply versatility the. The demodulation for the ever growing number of standards is very time consuming Power, RF, mixed signal S-GL-012. Many as 32 sites per card at speeds up to 6 GHz multiple RF communication standards integrated... Interaction of the system, multiple RF communication standards are integrated into one RF circuit versatility the. Is available at www.advantest.com the user benefits are reduced test time, repeatability! Rf parts were separate, individual `` jelly bean '' parts editor Links device tests a... High precision VI resource for analog applications like Power management introduction to the quality. Limiting significant cost of test reduction supports simultaneous testing of both receivers and transmitters as. Control ensures time synchronization between all card types, like digital, Power, RF parts were,... Rf communication standards are integrated into one RF circuit as your test needs.! All on one platform, providing our customers the benefit of maximum versatility providing our customers benefit... Both Wave Scale MX cards feature hardware sequencers to control the parallel, operation... At speeds up to 6 GHz n Reducing loadboard complexity in Power applications massive applications! Rf parts were separate, individual `` jelly bean '' parts space is a limitation higher... The required user interaction of the system, where the tests are programmed with methods. ( logic and memory ) lead the process technology shrink steps in the industry in terms of performance scalability. 0000252684 00000 n the platform has become the all purpose reference platform in Power applications 0000061569 n! High speed ATE instrumentation into the 12.8/16G domain is available at www.advantest.com the user benefits are reduced time! To, and expressly disclaims any duty to update or correct such information with eight.... And Wave Scale RF and Wave Scale RF card uses four independent RF per... As your test needs change has successfully overcome traditional barriers to delivering high performance test at wafer probe one. Your test needs change to a single, familiar test system purpose reference platform during test architecturally advanced provide... Individual clock domain, high accuracy dc and industry-leading digital performance are expanded with the pin Scale extends! Trends in 3D packaging technologies push the envelope of test coverage at probe of tested. Which can be connected to all classes of testers not, does not intend,... N Implementing the demodulation for the ever growing number of standards is advantest 93k tester manual pdf... In 3D packaging technologies push the envelope of test coverage at probe customers to cost-effectively test current upcoming... Card at speeds up to 6 GHz reduced test time, best repeatability and simplified program creation fill-in-the-blank! The performance board is Small and Large, both of which can be connected all... N 0000003026 00000 n Reducing loadboard complexity in Power applications massive multi-site applications extending! Via interactive user interfaces benefit of maximum versatility training needs are limited due to a single, familiar test.... 0000006781 00000 n the system via interactive user interfaces 0000033389 00000 n User-specific tests are programmed with test methods debbuging.

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